English Faculty Faculty & Research Physics

Lee, Shinbuhm



  • WebsiteXlab 링크이동
  • Phone+82.53.785.6524
  • OfficeE2-511
  • LabE2-517


  • Semiconductor
  • Energy
  • Sensor


ACADEMIC Ph. D., Seoul National University, Korea
CAREER Postdoctoral researcher at University of Cambridge (UK)
Postdoctoral researcher at Oak Ridge National Laboratory (US)

Our Researches

  • Semiconductor
  • Energy
  • Sensor

Representative Publications

2019 “Coherent-strained superconducting BaPb1-xBixO3 thin films by interface engineering.”
Jinkwon Kim, Junsik Mun, Bongju Kim, Han Gyeol Lee, Daesu Lee, Tae Heon Kim, SHINBUHM LEE, Miyoung Kim, Seo Hyoung Chang*, and Tae Won Noh*
Physical Review Materials 3, 113606 (2019)
2019 “Degradation mechanism of vanadium oxides films when grown on Y-stabilized ZrO2 above 500oC.”
Songhee Choi, Junhyeob Oh, Ji-Hyun Lee, Jae Hyuck Jang, and SHINBUHM LEE*
Advanced Engineering Materials 21, 1900918 (2019)
2019 “Sharp contrast in the electrical and optical properties of vanadium Wadsley (VmO2m+1, m > 1) epitaxial films selectively stabilized on (111)-oriented Y-stabilized ZrO2.”
Songhee Choi, Jaeseok Son, Junhyeob Oh, Ji-Hyun Lee, Jae Hyuck Jang, and SHINBUHM LEE*
Physical Review Materials 3, 063401 (2019)
2019 “Unraveling the origin and mechanism of nano-filament formation in polycrystalline SrTiO3 resistive switching memories.”
Deok-Hwang Kwon, SHINBUHM LEE, Chan Soon Kang, Yong Seok Choi, Sung Jin Kang, Hae Lim Cho, Woonbae Sohn, Janghyun Jo, Seung-Yong Lee, Kyu Hwan Oh, Tae Won Noh, Roger. A. De Souza, Manfred Martin*, and Miyoung Kim*
Advanced Materials 31, 1901322 (2019)
2018 “Electrochemically triggered metal–insulator transition between VO2 and V2O5.”
Qiyang Lu, Sean R. Bishop, Dongkyu Lee, SHINBUHM LEE, Hendrik Bluhm, Harry L. Tuller, Ho Nyung Lee, and Bilge Yildiz*
Advanced Functional Materials 28, 1803024 (2018)
2018 “Electrical and optical properties of VO2 polymorphic films grown epitaxially on Y-stabilized ZrO2.”
Songhee Choi, Sung-Jin Chang, Junhyeob Oh, Jae Hyuck Jang, and SHINBUHM LEE*
Advanced Electronic Materials 4, 1700620 (2018)